Investigation of phases and textures of binary V-Si coating deposited on vanadium-based alloy (V-4Cr-4Ti) using electron backscatter diffraction

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ژورنال

عنوان ژورنال: IOP Conference Series: Materials Science and Engineering

سال: 2015

ISSN: 1757-899X

DOI: 10.1088/1757-899x/82/1/012061